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The Allen‑Bradley 1762‑IR4, also cataloged as the 1762‑IR4 RTD/resistance input module, serves as the primary 4‑channel measurement interface used to execute low‑level RTD and resistive sensing across MicroLogix platforms.
| Parameter | Specification |
|---|---|
| Model | 1762‑IR4 |
| Brand | Allen‑Bradley |
| Origin | Not specified |
| Weight | Not specified |
| Dimensions | Not specified |
| Operating Temp | Not specified |
| Power Consumption | 40 mA @ 5 VDC, 50 mA @ 24 VDC |
| Product Type | RTD/Resistance Input Modules |
| Series | MicroLogix |
| Number of Channels | 4 |
| Accepted Inputs | Pt385, Pt3916, Cu426, Ni672, Ni618, Ni‑Fe518 |
| Resistance Range | 0–3000 ohm |
| Filter Frequency | 10 Hz–1 kHz |
| Temperature Units | deg C or deg F |
| Data Formats | Raw, Proportional, Engineering Units, EU×10, Scaled‑for‑PID, Percent Range |
| Accuracy (25 deg C) | RTD ±0.2…±0.6 deg C; Resistance ±0.5…±1.5 ohm |
| Accuracy (0–55 deg C) | RTD ±0.4…±1.1 deg C; Resistance ±0.25…±2.5 ohm |
| Channel Update Time | 6–303 ms (filter‑dependent) |
Although the 1762‑IR4 is an analog module, its sampling behavior aligns with Allen‑Bradley’s deterministic backplane timing. Channel update intervals (6–303 ms) integrate into fixed scan‑cycle propagation defined by the MicroLogix controller. I/O density scaling ensures that multiple analog modules maintain uniform timing without cross‑channel interference. Firmware flash compatibility resides entirely within the controller; the IR4 contains no programmable logic and provides stable, passive measurement behavior across firmware revisions.
Q: Can the 1762‑IR4 be hot‑swapped? A: No. MicroLogix modules must be inserted or removed only when the system is de‑energized.
Q: Does filter frequency affect update time? A: Yes. Higher filter frequencies reduce update time, while lower frequencies increase noise suppression.
Q: Are RTD and resistance channels isolated from each other? A: Channels are independently processed, but isolation is not channel‑to‑channel; wiring practices must prevent cross‑coupling.

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